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Physical Review Letters

Volumn 96, Issue 22, 2006, Pages

Charge inversion at high ionic strength studied by streaming currents

(5) Van Der Heyden, Frank H J a Stein, Derek a Besteman, Koen a Lemay, Serge G a Dekker, Cees a

a DELFT UNIVERSITY OF TECHNOLOGY (Netherlands)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRIC CURRENTS; IONIC STRENGTH; IONS; MATHEMATICAL MODELS; SILICA;

CHARGE INVERSION; SILICA NANOCHANNELS; SURFACE CHARGE;

CHARGE TRANSFER;

ION; ION CHANNEL; NANOMATERIAL; SILICON DIOXIDE;

CHEMICAL MODEL; CHEMISTRY; OSMOLARITY;

ION CHANNELS; IONS; MODELS, CHEMICAL; NANOSTRUCTURES; OSMOLAR CONCENTRATION; SILICON DIOXIDE;

EID: 33744786803 PISSN: 00319007 EISSN: 10797114 Source Type: Journal
DOI: 10.1103/PhysRevLett.96.224502 Document Type: Article

Times cited : (257)

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