Resolution revisited

Metrologia

Volumn 43, Issue 3, 2006, Pages

  Lira, Ignacio ^a  

^a PONTIFICIA UNIVERSIDAD CATÓLICA DE CHILE   (Chile)

Author keywords

[No Author keywords available]

Indexed keywords

APPROXIMATION THEORY; DATA REDUCTION; METRIC SYSTEM; STATISTICAL METHODS; UNCERTAIN SYSTEMS;

BAYESIAN STATISTICS; MEASUREMENT DATA; NUMERICAL APPROXIMATIONS; STANDARD UNCERTAINTY;

MEASUREMENT THEORY;

EID: 33744782883     PISSN: 00261394     EISSN: 16817575     Source Type: Journal    
DOI: 10.1088/0026-1394/43/3/N03     Document Type: Review

References (7)

1. Lira I and Wöger W 1997 The evaluation of standard uncertainty in the presence of limited resolution of indicating devices Meas. Sci. Technol. 8 441-3
2. Elster C 2000 Evaluation of measurement uncertainty in the presence of combined random and analogue-to-digital conversion errors Meas. Sci. Technol. 11 1359-63
3. Frenkel R B and Kirkup L 2005 Monte Carlo-based estimation of uncertainty owing to limited resolution of digital instruments Metrologia 42 L27-30
4. ISO 1993 Guide to the Expression of Uncertainty in Measurement (Geneva: International Organization for Standardization) Corrected and reprinted 1995
5. Wöger W and Lira I 2006 Comparison between the conventional and Bayesian approaches to evaluate measurement data Metrologia submitted
6. Kacker R and Jones A 2003 On use of Bayesian statistics to make the Guide to the Expression of Uncertainty in Measurement consistent Metrologia 40 235-48
7. Lira I 2002 Evaluating the Measurement Uncertainty. Fundamentals and Practical Guidance (Bristol: Institute of Physics Publishing) pp 176-8