Comparison between the conventional and Bayesian approaches to evaluate measurement data

Metrologia

Volumn 43, Issue 4, 2006, Pages

  Lira, Ignacio ^a   Wöger, Wolfgang ^b,c  

^a PONTIFICIA UNIVERSIDAD CATÓLICA DE CHILE   (Chile)

^b Physikalisch Technische Bundesanstalt ^*  (Germany)

^c PHYSIKALISCH TECHNISCHE BUNDESANSTALT   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

MATHEMATICAL MODELS; POISSON DISTRIBUTION; RANDOM PROCESSES; STATISTICAL METHODS;

BAYESIAN STATISTICAL THEORY; MEASUREMENT DATA; POISSON STATISTICS; SYSTEMATIC EFFECTS;

MEASUREMENT THEORY;

EID: 33746923502     PISSN: 00261394     EISSN: 16817575     Source Type: Journal    
DOI: 10.1088/0026-1394/43/4/S12     Document Type: Article

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