On use of Bayesian statistics to make the Guide to the Expression of Uncertainty in Measurement consistent

Metrologia

Volumn 40, Issue 5, 2003, Pages 235-248

  Kacker, R ^a   Jones, A ^a  

^a NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

DEGREES OF FREEDOM (MECHANICS); MEASUREMENTS; PROBABILITY DISTRIBUTIONS; STANDARDS; UNCERTAIN SYSTEMS;

BAYESIAN STATISTICS; CLASSICAL STATISTICAL ANALYSIS; UNCERTAINTY IN MEASUREMENT CONSISTENT; WELCH-SATTERTHWAITE FORMULA;

STATISTICAL METHODS;

EID: 0242304821     PISSN: 00261394     EISSN: None     Source Type: Journal    
DOI: 10.1088/0026-1394/40/5/305     Document Type: Article

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