-
1
-
-
84886448151
-
-
D. Edelstein, J. Heidenreich, R. Goldbatt, W. Cote, C. Uzoh, N. Lustig, P. Roper, T. McDevitt, W. Mostiff, A. Simon, J. Dukovic, R. Wachnik, H. Rathore, R. Schultz, L. Su, S. Luce, and J. Slattery, Proceedings of International Electron Devices Meeting (IED.M), p. 773, Washington, DC (1997).
-
Proceedings of International Electron Devices Meeting (IED.M), P. 773, Washington, DC (1997).
-
-
Edelstein, D.1
Heidenreich, J.2
Goldbatt, R.3
Cote, W.4
Uzoh, C.5
Lustig, N.6
Roper, P.7
McDevitt, T.8
Mostiff, W.9
Simon, A.10
Dukovic, J.11
Wachnik, R.12
Rathore, H.13
Schultz, R.14
Su, L.15
Luce, S.16
Slattery, J.17
-
2
-
-
33744754568
-
-
T. Hashimoto, T. Kikuchi, K. Watanabe, N. Ohashi, T. Saito, H. Yamaguchi, S. Wada, N. Natsuaki, Y. Kondo, S. Kondo, Y. Homma, N. Owada, and T. Ikeda, Proceedings of International Electron Devices Meeting (IED.M), No. 8-4, San Francisco, CA (1998).
-
Proceedings of International Electron Devices Meeting (IED.M), No. 8-4, San Francisco, CA (1998).
-
-
Hashimoto, T.1
Kikuchi, T.2
Watanabe, K.3
Ohashi, N.4
Saito, T.5
Yamaguchi, H.6
Wada, S.7
Natsuaki, N.8
Kondo, Y.9
Kondo, S.10
Homma, Y.11
Owada, N.12
Ikeda, T.13
-
3
-
-
0028516105
-
-
J. Steigerwald, R. Zirpoli, S. Murarka, D. Price, and R. Gutmann, J. Electrochem. Soc., 141,2842(1994).
-
J. Electrochem. Soc., 141,2842(1994).
-
-
Steigerwald, J.1
Zirpoli, R.2
Murarka, S.3
Price, D.4
Gutmann, R.5
-
4
-
-
33744772091
-
-
T. Park, T. Tugbawa, D. Boning, S. Hymes, T. Brown, K. Smekalin, and G. Schwanz, Chemical Mechanical Polishing in 1C Device Manufacturing III, R. L. Opila, C. Reidsema Simpson, K. B. Sundaram, I. Ali, Y. A. Arimoto, and Y. Homma, Editors, PV 99-37, p. 94, The Electrochemical Society Proceedings Series, Pennington, NJ (1999).
-
Chemical Mechanical Polishing in 1C Device Manufacturing III, R. L. Opila, C. Reidsema Simpson, K. B. Sundaram, I. Ali, Y. A. Arimoto, and Y. Homma, Editors, PV 99-37, P. 94, the Electrochemical Society Proceedings Series, Pennington, NJ (1999).
-
-
Park, T.1
Tugbawa, T.2
Boning, D.3
Hymes, S.4
Brown, T.5
Smekalin, K.6
Schwanz, G.7
-
5
-
-
33744770817
-
-
M. Fayolle, J. Lugand, F. Weimar, and W. Bruxvvoort, Proceedings of Chemical-Mechanical Planarization for ULSI Multilevel Interconnection Conference (CMP-MIC), p. 128, Santa Clara, CA (1998).
-
Proceedings of Chemical-Mechanical Planarization for ULSI Multilevel Interconnection Conference (CMP-MIC), P. 128, Santa Clara, CA (1998).
-
-
Fayolle, M.1
Lugand, J.2
Weimar, F.3
Bruxvvoort, W.4
-
7
-
-
33744757841
-
-
S. Ray, I. Ali, G. Shinn, N. Furusawa, R. Shah, S. Peterman, K. Wilt, S. Eastman, and P. Kumar, J. Eleclrochem. Soc., 1-J2, 216 (1995).
-
J. Eleclrochem. Soc., 1-J2, 216 (1995).
-
-
Ray, S.1
Ali, I.2
Shinn, G.3
Furusawa, N.4
Shah, R.5
Peterman, S.6
Wilt, K.7
Eastman, S.8
Kumar, P.9
-
8
-
-
33744746722
-
-
J. Larios, M. Ravkin, D. Hetherington, and J. Doyle, Semicond. Int., 121 (May 1996).
-
Semicond. Int., 121 (May 1996).
-
-
Larios, J.1
Ravkin, M.2
Hetherington, D.3
Doyle, J.4
-
10
-
-
84962869215
-
-
S. Kondo, N. Sakuma, Y. Homma, Y. Goto, N. Ohashi, H. Yamaguchi, and N. Owada, Proceedings of the International Interconnect Technology Conference (IITC), San Francisco, p. 253 (2000).
-
Proceedings of the International Interconnect Technology Conference (IITC), San Francisco, P. 253 (2000).
-
-
Kondo, S.1
Sakuma, N.2
Homma, Y.3
Goto, Y.4
Ohashi, N.5
Yamaguchi, H.6
Owada, N.7
-
11
-
-
0026260129
-
-
F. Kaufman, D. Thompson, R. Broadie, M. Jaso, W. Guthrie, D. Pearson, and M. Small, J. Electrochem. Soc., 138, 3460 (1991).
-
J. Electrochem. Soc., 138, 3460 (1991).
-
-
Kaufman, F.1
Thompson, D.2
Broadie, R.3
Jaso, M.4
Guthrie, W.5
Pearson, D.6
Small, M.7
-
14
-
-
0033893412
-
-
Y. Homma, S. Kondo, N. Sakuma, K. Hinode, J. Noguchi, N. Ohashi, H. Yamaguchi, and N. Owada, J. Electrochem. Soc., 147, 1193 (2000).
-
J. Electrochem. Soc., 147, 1193 (2000).
-
-
Homma, Y.1
Kondo, S.2
Sakuma, N.3
Hinode, K.4
Noguchi, J.5
Ohashi, N.6
Yamaguchi, H.7
Owada, N.8
-
15
-
-
33744775171
-
-
S. Kondo, N. Sakuma, Y. Homma, and N. Ohashi, Electrochemical Processing in ULSI Fabrication I and Interconnect and Contact Metallization: Materials, Pro-ceses, and Reliability, P. C. Andricacos, J. O. Dukovic, G. S. Mathad, G. M. Oleszek, H. S. Rathore, and C. Reidsema Simpson, Editors, PV 98-6, p. 195, The Electrochemical Society Proceedings Series, Pennington, NJ (1998).
-
Electrochemical Processing in ULSI Fabrication I and Interconnect and Contact Metallization: Materials, Pro-ceses, and Reliability, P. C. Andricacos, J. O. Dukovic, G. S. Mathad, G. M. Oleszek, H. S. Rathore, and C. Reidsema Simpson, Editors, PV 98-6, P. 195, the Electrochemical Society Proceedings Series, Pennington, NJ (1998).
-
-
Kondo, S.1
Sakuma, N.2
Homma, Y.3
Ohashi, N.4
-
16
-
-
33744754566
-
-
S. Wang, V. Brusic, J. Hawkins, I. Cherian, L. Knowles, C. Schmidt, B. Cruz, K. Miller, D. Garcia, H. Chou, C. Baker, G. Grover, and C. Yu, Proceedings of Chemical-Mechanical Planarization for ULSI Multilevel Interconnection Conference, CMP-MIC Conference, p. 477, Santa Clara, CA (2000).
-
Proceedings of Chemical-Mechanical Planarization for ULSI Multilevel Interconnection Conference, CMP-MIC Conference, P. 477, Santa Clara, CA (2000).
-
-
Wang, S.1
Brusic, V.2
Hawkins, J.3
Cherian, I.4
Knowles, L.5
Schmidt, C.6
Cruz, B.7
Miller, K.8
Garcia, D.9
Chou, H.10
Baker, C.11
Grover, G.12
Yu C13
-
17
-
-
33744747429
-
-
H. Yamaguchi, N. Ohashi, T. Imai, K. Torii, J. Noguchi, T. Fujiwara, T. Saito, N.
-
-
-
Yamaguchi, H.1
Ohashi, N.2
Imai, T.3
Torii, K.4
Noguchi, J.5
Fujiwara, T.6
Saito, T.7
-
18
-
-
33744733223
-
-
Owada, Y. Homma, S. Kondo, and K. Hinode, Proceedings of the International Interconnect Technology Conference (/ITC), San Francisco, CA, p. 264 (2000).
-
Proceedings of the International Interconnect Technology Conference (/ITC), San Francisco, CA, P. 264 (2000).
-
-
Owada1
Homma, Y.2
Kondo, S.3
Hinode, K.4
-
19
-
-
0033732438
-
-
J. Noguchi, N. Ohashi, J. Yasuda, T. Jimbo, H. Yamaguchi, N. Owada, K. Takeda, and K. Hinode, Proceedings of the 38th Annual International Reliability Physics Symposium (IRPS), San Jose, CA, p. 339 (2000).
-
Proceedings of the 38th Annual International Reliability Physics Symposium (IRPS), San Jose, CA, P. 339 (2000).
-
-
Noguchi, J.1
Ohashi, N.2
Yasuda, J.3
Jimbo, T.4
Yamaguchi, H.5
Owada, N.6
Takeda, K.7
Hinode, K.8
-
20
-
-
84962856861
-
-
T. Furusawa, N. Sakuma, D. Ryuzaki, S. Kondo, K. Takeda, S. Machida, and K. Hinode, Proceedings of the International Interconnect Technology Conference (IITC), San Francisco, CA, p. 222 (2000).
-
Proceedings of the International Interconnect Technology Conference (IITC), San Francisco, CA, P. 222 (2000).
-
-
Furusawa, T.1
Sakuma, N.2
Ryuzaki, D.3
Kondo, S.4
Takeda, K.5
Machida, S.6
Hinode, K.7
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