Ellipsometric investigation of optical constant and energy band gap of Zn 1-x Mn x Se/GaAs (1 0 0) epilayers

Applied Surface Science

Volumn 252, Issue 16, 2006, Pages 5745-5751

  Kim, D J ^a   Yu, Y M ^a   Choi, Y D ^a   Lee, J W ^b  

^a Mokwon University   (South Korea)

^b Hanbat National University   (South Korea)

Author keywords

Hot wall epitaxy; Pseudodielectric constant; Spectroscopic ellipsometer; ZnMnSe

Indexed keywords

BAND STRUCTURE; COMPOSITION; DERIVATIVES; ELLIPSOMETRY; GALLIUM COMPOUNDS; MANGANESE; NUMERICAL ANALYSIS; SPECTROSCOPIC ANALYSIS;

EPILAYERS; HOT-WALL EPITAXY; OPTICAL CONSTANT; PSEUDODIELECTRIC CONSTANT; PSEUDODIELECTRIC FUNCTION SPECTRA; SPECTROSCOPIC ELLIPSOMETER; ZNMNSE;

ZINC COMPOUNDS;

EID: 33744545519     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.apsusc.2005.07.037     Document Type: Article

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