Defect analysis in organic semiconductors

Materials Science in Semiconductor Processing

Volumn 9, Issue 1-3, 2006, Pages 198-203

  Nguyen, T P ^a  

^a INSTITUT DES MATÉRIAUX JEAN ROUXEL   (France)

Author keywords

Defects; Organic semiconductors; Traps

Indexed keywords

DEFECTS; ELECTRON TRAPS; MAGNETIC PROPERTIES; OPTICAL PROPERTIES; SEMICONDUCTOR DEVICES; SPECTROSCOPIC ANALYSIS;

IMPEDANCE SPECTROSCOPY; MOLECULAR BONDS; SPECIFIC PROBLEMS; STIMULATED CURRENTS;

SEMICONDUCTING ORGANIC COMPOUNDS;

EID: 33744519604     PISSN: 13698001     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.mssp.2006.01.060     Document Type: Article

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