Optical properties of Fe-doped silica films on Si

Applied Surface Science

Volumn 252, Issue 15, 2006, Pages 5391-5394

  Babonas, G J ^a   Reza, A ^a,b   Simkiene, I ^a   Sabataityte, J ^a   Baran, M ^c   Szymczak, R ^c   Karlsson, U O ^d   Suchodolskis, A ^a,d  

^a CENTER FOR PHYSICAL SCIENCES AND TECHNOLOGY   (Lithuania)

^b VYTAUTAS MAGNUS UNIVERSITY   (Lithuania)

^c INSTITUTE OF PHYSICS   (Poland)

^d ROYAL INSTITUTE OF TECHNOLOGY   (Sweden)

Author keywords

AFM of surfaces; Optical properties of composite materials; Structure of nanoscale materials

Indexed keywords

ATOMIC FORCE MICROSCOPY; DOPING (ADDITIVES); IRON; MAXWELL EQUATIONS; OPTICS; SILICON; THIN FILMS;

AFM OF SURFACES; ELLIPSOMETRIC TECHNIQUE; OPTICAL PROPERTIES OF COMPOSITE MATERIALS; STRUCTURE OF NANOSCALE MATERIALS; TETRAETHOXYSILANE (TEOS);

SILICA;

EID: 33744507890     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.apsusc.2005.12.047     Document Type: Article

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