Second-harmonic and reflectance-anisotropy spectroscopy of vicinal Si (001) Si O2 interfaces: Experiment and simplified microscopic model

Physical Review B - Condensed Matter and Materials Physics

Volumn 73, Issue 19, 2006, Pages

  Kwon, Jinhee ^b   Downer, M C ^b   Mendoza, B S ^a  

^a CENTRO DE INVESTIGACIONES EN ÓPTICA   (Mexico)

^b NONE

Author keywords

[No Author keywords available]

Indexed keywords

EID: 33744469028     PISSN: 10980121     EISSN: 1550235X     Source Type: Journal    
DOI: 10.1103/PhysRevB.73.195330     Document Type: Article

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