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Volumn 26, Issue 1, 2006, Pages
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Micro-structure and mechanical properties of C/C multilayers films grown by filtered cathodic vacuum arc deposition
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Author keywords
C C multilayer films; Filtered cathodic vacuum arc (FCVA); Raman spectroscopy; Wear resistance; XPS
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Indexed keywords
CHARACTERIZATION;
ELECTRIC ARCS;
MAGNETIC FILTERS;
MAGNETRON SPUTTERING;
MECHANICAL PROPERTIES;
MICROSTRUCTURE;
MULTILAYERS;
RAMAN SPECTROSCOPY;
SPUTTER DEPOSITION;
STAINLESS STEEL;
SUBSTRATES;
THIN FILMS;
TITANIUM;
VACUUM TECHNOLOGY;
WEAR RESISTANCE;
X RAY PHOTOELECTRON SPECTROSCOPY;
C/C MULTILAYER FILMS;
FILTERED CATHODIC VACUUM ARC (FCVA);
FRICTION COEFFICIENT;
INDENTATION HARDNESS;
PIN-ON-DISK TRIBOMETER;
STAINLESS STEEL SUBSTRATES;
CARBON CARBON COMPOSITES;
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EID: 33646934953
PISSN: 16727126
EISSN: None
Source Type: Journal
DOI: None Document Type: Article |
Times cited : (1)
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References (13)
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