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Volumn 45, Issue 4 B, 2006, Pages 3243-3246
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Reversible resistive switching in Bi4Ti3O 12 thin films deposited by electron cyclotron resonance sputtering
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Author keywords
Bismuth titanate; Electron cyclotron resonance sputter deposition; High resistance state; Low resistance state; Reversible resistive switching; Stack capacitance structure
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Indexed keywords
BISMUTH COMPOUNDS;
CURRENT VOLTAGE CHARACTERISTICS;
DEPOSITION;
ELECTRON CYCLOTRON RESONANCE;
SPUTTERING;
THIN FILMS;
BISMUTH TITANATE;
ELECTRON CYCLOTRON RESONANCE SPUTTER DEPOSITION;
HIGH-RESISTANCE STATE;
LOW-RESISTANCE STATE;
REVERSIBLE RESISTIVE SWITCHING;
STACK CAPACITANCE STRUCTURE;
SWITCHING;
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EID: 33646932965
PISSN: 00214922
EISSN: 13474065
Source Type: Journal
DOI: 10.1143/JJAP.45.3243 Document Type: Article |
Times cited : (7)
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References (11)
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