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Volumn 101, Issue 9, 1997, Pages 1198-1203

Ab initio modelling of defects in non-metallic systems

Author keywords

Clusters; Luminescence; Quantum Mechanics; Semiconductors

Indexed keywords


EID: 33646915186     PISSN: 0940483X     EISSN: None     Source Type: Journal    
DOI: 10.1002/bbpc.199700025     Document Type: Article
Times cited : (1)

References (31)
  • 1
    • 0004086809 scopus 로고    scopus 로고
    • The Ab Initio Cluster Method and the Dynamics of Defects in Semiconductors
    • ed. by M. Stavola, Semiconductors and Semimetals, R.K. Willardson, A.C. Beer, and E.R. Weber (treatise eds.), Academic Press, in press
    • R. Jones and P. R. Briddon, The Ab Initio Cluster Method and the Dynamics of Defects in Semiconductors, in: Identification of Defects in Semiconductors, ed. by M. Stavola, Semiconductors and Semimetals, R.K. Willardson, A.C. Beer, and E.R. Weber (treatise eds.), Academic Press, in press 1997.
    • (1997) Identification of Defects in Semiconductors
    • Jones, R.1    Briddon, P.R.2
  • 11
    • 0004101812 scopus 로고
    • Springer Series in Solid-State Sciences 22, ed. by M. Cardona, Springer, New York
    • M. Lannoo and J. Bourgoin, Point defects in semiconductors, Vols. I and II, Springer Series in Solid-State Sciences 22, ed. by M. Cardona, Springer, New York, 1981.
    • (1981) Point Defects in Semiconductors , vol.1-2
    • Lannoo, M.1    Bourgoin, J.2
  • 16
    • 0000877515 scopus 로고
    • ed. by J.E. Field, Academic Press, London
    • G. Davies, in: The Properties of Diamond, p. 165, ed. by J.E. Field, Academic Press, London, 1979.
    • (1979) The Properties of Diamond , pp. 165
    • Davies, G.1
  • 22
    • 33646941274 scopus 로고    scopus 로고
    • ed. by R. Jones, NATO ASI Series 3 (High Technology), Kluwer Academic Publishers, Dordrecht
    • E. C. Lightowlers and G. Davies, in: Early Stages of Oxygen Precipitation in Silicon, ed. by R. Jones, NATO ASI Series 3 (High Technology), Vol. 17, p. 303-319, Kluwer Academic Publishers, Dordrecht, 1996.
    • (1996) Early Stages of Oxygen Precipitation in Silicon , vol.17 , pp. 303-319
    • Lightowlers, E.C.1    Davies, G.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.