Frequency- and time-resolved measurements of FeTaN films with longitudinal bias fields

Journal of Applied Physics

Volumn 87, Issue 9 III, 2000, Pages 6633-6635

  Alexander Jr , C ^a   Rantschler, J ^a   Silva, T J ^b   Kabos, P ^b  

^a University of Alabama   (United States)

^b NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 4243196204     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.372794     Document Type: Article

References (13)

1. K. B. Klaassen, R. G. Hirko, and J. T. Contreras, IEEE Trans. Magn. 34, 1822 (1998).
2. B. Viala, M. K. Minor, and J. A. Barnard, J. Appl. Phys. 80, 3941 (1996).
3. M. K. Minor and J. A. Barnard, J. Appl. Phys. 85, 4567 (1999).
4. V. R. Inturi and J. A. Barnard, IEEE Trans. Magn. 31, 2660 (1995).
5. W. Dietrich, W. E. Proebster, and P. Wolf, IBM Journal, April, 1960, p. 189.
6. W. Dietrich and W. E. Proebster, J. Appl. Phys. 31, 281S (1960).
7. P. Wolf, J. Appl. Phys. 32, 95S (1960).
8. T. J. Silva, C. S Lee, T. M. Crawford, and C. T. Rogers, J. Appl. Phys. 85, 7849 (1999).
9. M. Yamaguchi, S. Yabukami, and K. I. Arai, IEEE Trans. Magn. 33, 3619 (1997).
10. J. Baker-Jarvis, Smart Mater. Struct. 2, 113 (1993).
11. W. T. Grandy, Jr., Foundations of Statistical Mechanics, Vol. II (Reidel, Dordrecht, 1987).
12. J. C. Mallinson, The Foundations of Magnetic Recording, 2nd. ed. (Academic, San Diego, CA, 1993), p. 92.
13. E. van de Riet and F. Rooseboom, J. Appl. Phys. 81, 350 (1997).