Magnetic properties of nanocrystalline FeNiN thin films

Physica Status Solidi (A) Applications and Materials Science

Volumn 203, Issue 6, 2006, Pages 1442-1447

  Prieto, P ^a   Camarero, J ^a   Sacristan, N ^a   Boerma, D O ^b   Sanz, J M ^a  

^a INSTITUTO NICOLÁS CABRERA   (Spain)

^b CENTRO DE MICROANÁLISIS DE MATERIALES   (Spain)

Author keywords

[No Author keywords available]

Indexed keywords

DUAL ION BEAM SPUTTERING SYSTEM; FENIN THIN FILMS; IN-PLANE MAGNETIC ANISOTROPY; VECTORIAL KERR MAGNETOMETRY;

MAGNETIC ANISOTROPY; MAGNETISM; MAGNETOMETERS; NANOSTRUCTURED MATERIALS; NICKEL; X RAY DIFFRACTION; X RAY PHOTOELECTRON SPECTROSCOPY;

THIN FILMS;

EID: 33646796741     PISSN: 18626300     EISSN: 18626319     Source Type: Journal    
DOI: 10.1002/pssa.200566187     Document Type: Conference Paper

References (12)

1. J. M. D. Coey and P. A. I. Smith, J. Magn. Magn. Mater. 200, 405 (1999).
2. H. Y. Wang, Y. J. He, Z. W. Ma, E. Y. Jiang, H. S. Huang, and W. H. Mao, J. Appl. Phys. 85(7), 3745 (1999).
3. P. Mohn, K. Schwarz, S. Matar, and G. Demazeau, Phys. Rev. B 45, 4000 (1992).
4. H. Wang, J. Liu, Y. J. He, W. Mao, H. Chen, H. Zhang, H. Hang, and E. Jiang, J. Appl. Phys. 91, 1453 (2002).
5. L. I. Zhuge, W. G. Yao, and X. M. Wu, J. Appl. Phys. 93, 4704 (2003).
6. H. N. Nie, S. Y. Xu, C. K. Ong, D. X. Li, and J. P. Wang, Thin Solid Films 440, 35 (2003).
7. B. D. Cullity, Elements of X-ray diffraction (Addison-Wesley, M.A., 1978).
8. J. Camarero, J. Sort, A. Hoffmann, J. M. García-Martín, B. Dieny, R. Miranda, and J. Nogués, Phys. Rev. Lett. 95, 057204 (2005).
9. P. Prieto, F. J. Palomares, J. M. Gonzalez, R. Pérez-Casero, and J. M. Sanz, Surf. Interface Anal. 38 (2006) (in press).
10. J. S. Chen, S. P. Lau, Y. B. Zhang, Z. Sun, B. K. Tay, and C. Q. Sun, Thin Solid Films 443, 115 (2003).
11. S. Goolaup, N. Singh, A. O. Adeyeye, N. Ng, and M. B. A. Jalil, Eur. Phys. J. B 44, 259 (2005).
12. J. Zhou, R. Skomski, A. Kashyap, K. D. Sorge, Y. Sui, M. Daniil, L. Gao, M. L. Yan, S. H. Liou, R. D. Kirby, and D. J. Sellmyer, J. Magn. Magn. Mater. 290, 227 (2005).