Structural, chemical and magnetic characterization of iron nitride thin films

Surface and Interface Analysis

Volumn 38, Issue 4, 2006, Pages 392-395

  Prieto, P ^a   Palomares, F J ^b   Gonzalez, J M ^b   Perez Casero R ^a   Sanz, J M ^a  

^a UNIVERSIDAD AUTÓNOMA DE MADRID   (Spain)

^b INSTITUTO DE CIENCIA DE MATERIALES DE MADRID   (Spain)

Author keywords

AES depth profiling; Iron nitride; Magnetic properties

Indexed keywords

ION BOMBARDMENT; IRON COMPOUNDS; MAGNETIC MOMENTS; MAGNETRON SPUTTERING; RUTHERFORD BACKSCATTERING SPECTROSCOPY; X RAY DIFFRACTION;

AES-DEPTH PROFILING; IRON NITRIDE; VIBRATING SAMPLE MAGNETOMETER (VSM);

THIN FILMS;

EID: 33646544759     PISSN: 01422421     EISSN: 10969918     Source Type: Journal    
DOI: 10.1002/sia.2220     Document Type: Conference Paper

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