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Volumn 51, Issue 23, 2006, Pages 4886-4891
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In situ synchrotron radiation grazing incidence X-ray diffraction-A powerful technique for the characterization of solid-state ion-selective electrode surfaces
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Author keywords
Atomic force microscopy; Chalcogenide glass; Electrode dynamics; Ion selective electrode; Synchrotron radiation grazing incidence X ray diffraction
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Indexed keywords
ATOMIC FORCE MICROSCOPY;
ION SELECTIVE ELECTRODES;
IRON COMPOUNDS;
SEMICONDUCTING GERMANIUM COMPOUNDS;
SOLID STATE DEVICES;
SURFACE CHEMISTRY;
CHALCOGENIDE GLASS;
ELECTRODE DYNAMICS;
SYNCHROTRON RADIATION GRAZING INCIDENCE X-RAY DIFFRACTION;
X RAY DIFFRACTION ANALYSIS;
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EID: 33646793358
PISSN: 00134686
EISSN: None
Source Type: Journal
DOI: 10.1016/j.electacta.2006.01.034 Document Type: Article |
Times cited : (11)
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References (38)
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