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Volumn 51, Issue 23, 2006, Pages 4886-4891

In situ synchrotron radiation grazing incidence X-ray diffraction-A powerful technique for the characterization of solid-state ion-selective electrode surfaces

Author keywords

Atomic force microscopy; Chalcogenide glass; Electrode dynamics; Ion selective electrode; Synchrotron radiation grazing incidence X ray diffraction

Indexed keywords

ATOMIC FORCE MICROSCOPY; ION SELECTIVE ELECTRODES; IRON COMPOUNDS; SEMICONDUCTING GERMANIUM COMPOUNDS; SOLID STATE DEVICES; SURFACE CHEMISTRY;

EID: 33646793358     PISSN: 00134686     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.electacta.2006.01.034     Document Type: Article
Times cited : (11)

References (38)
  • 35
    • 33646775517 scopus 로고    scopus 로고
    • R. De Marco, Z.T. Jiang, J. Martizano, A. Lowe, B. Pejcic, A. van Riessen, Electrochim. Acta, in review.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.