Multi-method analysis of the metal/electrolyte interface: Scanning force microscopy (SFM), quartz microbalance measurements (QMB), fourier transform infrared spectroscopy (FTIR) and grazing incidence x-ray diffractometry (GIXD) at a polycrystalline copper electrode

Surface and Interface Analysis

Volumn 25, Issue 7-8, 1997, Pages 548-560

  Kautek, W ^a   Geuss M ^a   Sahre, M ^a   Zhao, P ^a,b   Mirwald, S ^a  

^a BAM FEDERAL INSTITUTE FOR MATERIALS RESEARCH AND TESTING   (Germany)

^b UNIVERSITY OF GEORGIA   (United States)

Author keywords

Buried interfaces; Copper; Electrochemical conversion; Electrochemical corrosion; Fourier transform infrared spectroscopy; In situ analysis; Quartz microbalance; Scanning force microscopy; X ray diffractometry

Indexed keywords

AMORPHOUS MATERIALS; COPPER; CRYSTAL GROWTH; CRYSTAL ORIENTATION; ELECTROCHEMICAL CORROSION; ELECTROCHEMICAL ELECTRODES; ELECTROLYTES; ELECTROLYTIC POLISHING; FOURIER TRANSFORM INFRARED SPECTROSCOPY; MORPHOLOGY; POLYCRYSTALLINE MATERIALS; X RAY CRYSTALLOGRAPHY;

ELECTROCHEMICAL CONVERSION; GRAZING INCIDENCE X RAY DIFFRACTOMETRY (GIXD); QUARTZ MICROBALANCE MEASUREMENTS (QMB); SCANNING FORCE MICROSCOPY (SFM);

INTERFACES (MATERIALS);

EID: 0031152960     PISSN: 01422421     EISSN: None     Source Type: Journal    
DOI: 10.1002/(sici)1096-9918(199706)25:7/8<548::aid-sia269>3.0.co;2-b     Document Type: Article

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