ISE and ISFET microsensors based on a sensitive chalcogenide glass for copper ion detection in solution

Sensors and Actuators, B: Chemical

Volumn 59, Issue 2, 1999, Pages 123-127

  Taillades, G ^a,b   Valls, O ^a,b   Bratov, A ^b   Dominguez, C ^b   Pradel, A ^a   Ribes, M ^a  

^a UNIVERSITÉ DE MONTPELLIER   (France)

^b UNIVERSITAT AUTÒNOMA DE BARCELONA   (Spain)

Author keywords

[No Author keywords available]

Indexed keywords

COPPER; ELECTRON MICROSCOPY; FIELD EFFECT TRANSISTORS; MEMBRANES; PHOTOLITHOGRAPHY; POSITIVE IONS; SEMICONDUCTING FILMS; SEMICONDUCTING GERMANIUM COMPOUNDS; SEMICONDUCTING GLASS; SEMICONDUCTOR DOPING; SPUTTER DEPOSITION; TRANSDUCERS;

CHALCOGENIDE GLASS; DETECTION LIMITS; ELECTRON MICROPROBE ANALYSIS; ION SENSITIVE FIELD EFFECT TRANSISTORS (ISFET);

MICROSENSORS;

EID: 0033358346     PISSN: 09254005     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0925-4005(99)00208-7     Document Type: Article

References (8)

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