Spin-polarized scanning tunneling microscopy and spectroscopy study of c (2×2) reconstructed Cr(001) thin film surfaces

Journal of Applied Physics

Volumn 99, Issue 8, 2006, Pages

  Oka, Hirofumi ^a   Sueoka, Kazuhisa ^a  

^a HOKKAIDO UNIVERSITY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

CHROMIUM; ELECTRONIC PROPERTIES; FERMI LEVEL; SCANNING ELECTRON MICROSCOPY; SPECTROSCOPIC ANALYSIS; SPECTRUM ANALYSIS;

SPIN DEPENDENT ELECTRONIC PROPERTIES; SPIN-POLARIZED FEATURE; SPIN-POLARIZED SCANNING TUNNELING MICROSCOPY; SURFACE STATE PEAK;

THIN FILMS;

EID: 33646777494     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2173634     Document Type: Article

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