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Volumn 99, Issue 8, 2006, Pages

Reduction of switching field distributions by edge oxidization of submicron magnetoresistive tunneling junction cells for high-density magnetoresistive random access memories

Author keywords

[No Author keywords available]

Indexed keywords

MAGNETIZATION; MAGNETORESISTANCE; OXIDATION; REDUCTION; SWITCHING FUNCTIONS; TUNNEL JUNCTIONS;

EID: 33646752353     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2165138     Document Type: Article
Times cited : (15)

References (6)
  • 5
    • 27744538802 scopus 로고    scopus 로고
    • Proceedings of the INTERMAG Conference, Nagoya, Japan, 5-8 April
    • N. Shimomura, Proceedings of the INTERMAG Conference, Nagoya, Japan, 5-8 April 2005 [IEEE Trans. Magn. 41, 2652 (2005)].
    • (2005) IEEE Trans. Magn. , vol.41 , pp. 2652
    • Shimomura, N.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.