Investigation of Permalloy cross structure using magnetic force microscope and magnetoresistance measurement

Journal of Applied Physics

Volumn 99, Issue 8, 2006, Pages

  Chang, Y C ^b   Chang, C C ^b   Chang, Ida ^b   Wu, J C ^b   Wei, Zung Hang ^a   Lai, Mei Feng ^a   Chang, Ching Ray ^a  

^a NATIONAL TAIWAN UNIVERSITY   (Taiwan)

^b NONE

Author keywords

[No Author keywords available]

Indexed keywords

MAGNETIC PROPERTIES; MAGNETIZATION; MAGNETORESISTANCE; MICROSCOPIC EXAMINATION; MICROSTRUCTURE; THIN FILMS;

MAGNETIC CONFIGURATIONS; MAGNETIC FORCE MICROSCOPE; MAGNETIC PATTERN; PERMALLOY;

FERROMAGNETIC MATERIALS;

EID: 33646748463     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2177205     Document Type: Article

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