Investigation on the dynamics of cross-tie walls in elliptical permalloy elements

IEEE Transactions on Magnetics

Volumn 41, Issue 2, 2005, Pages 959-961

  Chang, Y C ^a   Chang, C C ^a   Hsieh, W Z ^a   Lee, H M ^a   Wu, J C ^a  

^a NATIONAL CHANGHUA UNIVERSITY OF EDUCATION   (Taiwan)

Author keywords

Cross tie wall; Magnetic force microscope (MFM); Magnetization switching; Magnetoresistance; Permalloy

Indexed keywords

ELECTRON BEAM LITHOGRAPHY; MAGNETIC FIELDS; MAGNETORESISTANCE; MAGNETOSTATICS; SCANNING ELECTRON MICROSCOPY; SHAPE MEMORY EFFECT;

CROSS-TIE WALL; MAGNETIC-FORCE MICROSCOPE (MFM); MAGNETIZATION SWITCHING; PERMALLOY;

MAGNETIZATION;

EID: 14544273195     PISSN: 00189464     EISSN: None     Source Type: Journal    
DOI: 10.1109/TMAG.2004.842135     Document Type: Article

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