Properties of a dielectric probe for scanning near-field millimeter-wave microscopy

Journal of Applied Physics

Volumn 99, Issue 5, 2006, Pages

  Kume, Eiji ^a   Sakai, Shigeki ^a  

^a NATIONAL INSTITUTE OF ADVANCED INDUSTRIAL SCIENCE AND TECHNOLOGY AIST   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

DIELECTRIC MATERIALS; MILLIMETER WAVES; POLYTETRAFLUOROETHYLENES; PROBES; SCANNING; THREE DIMENSIONAL; ELECTROMAGNETIC WAVES; SCANNING TUNNELING MICROSCOPY; THREE DIMENSIONAL COMPUTER GRAPHICS;

DIELECTRIC PROBES; SCANNING NEAR-FIELD MILLIMETER-WAVE MICROSCOPY; THREE-DIMENSIONAL SCANNING; WAVELENGTH LEVEL; MILLIMETER-WAVE POWER; NEAR-FIELD MILLIMETER WAVE MICROSCOPY;

MICROSCOPIC EXAMINATION; DIELECTRIC MATERIALS;

EID: 33646729142     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2174110     Document Type: Article

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