Factory cycle-time prediction with a data-mining approach

IEEE Transactions on Semiconductor Manufacturing

Volumn 19, Issue 2, 2006, Pages 252-258

  Backus, Phillip ^a   Janakiram, Mani ^b   Mowzoon, Shahin ^b   Runger, George C ^c   Bhargava, Amit ^d  

^a Nissan North America   (United States)

^b INTEL CORPORATION   (United States)

^c AZ 85281   (United States)

^d HONEYWELL   (United States)

Author keywords

Due date; Scheduling; Statistical models; Work in progress (WIP)

Indexed keywords

DUE DATE; STATISTICAL MODELS; WORK-IN-PROGRESS (WIP);

ALGORITHMS; MATHEMATICAL MODELS; RESOURCE ALLOCATION; SCHEDULING; SEMICONDUCTOR DEVICE MANUFACTURE;

DATA MINING;

EID: 33646721935     PISSN: 08946507     EISSN: None     Source Type: Journal    
DOI: 10.1109/TSM.2006.873400     Document Type: Article

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