Auger photoelectron coincidence spectroscopy: Simplifying complexity

Surface and Interface Analysis

Volumn 38, Issue 4, 2006, Pages 691-698

  Van Riessen, G A ^a   Thurgate, S M ^a  

^a MURDOCH UNIVERSITY   (Australia)

Author keywords

Auger electron coincidence spectroscopy; Auger electron spectroscopy; Coincidence photoelectron lineshape; Delay line detector; X ray photoelectron spectroscopy

Indexed keywords

OPTICAL RESOLVING POWER; SYNCHROTRON RADIATION; THIN FILMS; X RAY PHOTOELECTRON SPECTROSCOPY;

AUGER ELECTRON COINCIDENCE SPECTROSCOPY; COINCIDENCE PHOTOELECTRON LINESHAPE; DELAY-LINE DETECTORS;

AUGER ELECTRON SPECTROSCOPY;

EID: 33646685709     PISSN: 01422421     EISSN: 10969918     Source Type: Journal    
DOI: 10.1002/sia.2332     Document Type: Conference Paper

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