Photoelectron-auger electron coincidence study for condensed matter

Journal of Electron Spectroscopy and Related Phenomena

Volumn 141, Issue 2-3, 2004, Pages 149-159

  Stefani, G ^a   Gotter, R ^b   Ruocco, A ^a   Offi, F ^a   Da Pieve, F ^a   Iacobucci, S ^c   Morgante, A ^b   Verdini, A ^b   Liscio, A ^c   Yao, H ^d   Bartynski, R A ^d  

^a ROMA TRE UNIVERSITY   (Italy)

^b LABORATORIO TASC   (Italy)

^c CNR   (Italy)

^d RUTGERS UNIVERSITY   (United States)

Author keywords

Angle resolved; Auger electron; Auger photoelectron coincidence; Cu; Ge; Graphite; Photoelectron; Sio2

Indexed keywords

LARGE SCALE SYSTEMS; MAGNETORESISTANCE; PHOTOELECTRON SPECTROSCOPY; QUANTUM THEORY; SENSITIVITY ANALYSIS; SOLID STATE DEVICES;

ANGLE-RESOLVED; AUGER ELECTRON; AUGER-PHOTOELECTRON COINCIDENCE; PHOTOELECTRON;

AUGER ELECTRON SPECTROSCOPY;

EID: 8444221686     PISSN: 03682048     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.elspec.2004.06.005     Document Type: Article

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