Local electronic structure analysis using a photoelectron emission microscope (PEEM) with hard X-ray

e-Journal of Surface Science and Nanotechnology

Volumn 4, Issue , 2006, Pages 490-493

  Kotsugi, M ^a   Wakita, T ^b   Taniuchi, T ^c   Ono, K ^d   Suzuki, M ^b   Kawamura, N ^b   MTakagaki, ^b   Taniguchi, M ^a,e   Kobayashi, K ^b   Oshima, M ^c   Ishimatsu, N ^e   Maruyama, H ^e  

^a HIROSHIMA UNIVERSITY   (Japan)

^b JAPAN SYNCHROTRON RADIATION RESEARCH INSTITUTE   (Japan)

^c UNIVERSITY OF TOKYO   (Japan)

^d HIGH ENERGY ACCELERATOR RESEARCH ORGANIZATION KEK   (Japan)

^e HIROSHIMA UNIVERSITY   (Japan)

Author keywords

Gibeon iron meteorite; Hard X ray synchrotron radiation; Photoelectron emission microscope; Widmanst tten pattern; X ray absorption fine structure

Indexed keywords

COMPOSITION; ELECTRON MICROSCOPES; ELECTRONIC PROPERTIES; IRON; X RAY ANALYSIS;

GIBEON IRON METEORITE; HARD X-RAY SYNCHROTRON RADIATION; PHOTOELECTRON EMISSION MICROSCOPES; WIDMANSTÄTTEN PATTERN; X-RAY ABSORPTION FINE STRUCTURE;

ELECTRONIC STRUCTURE;

EID: 33646674082     PISSN: 13480391     EISSN: 13480391     Source Type: Journal    
DOI: 10.1380/ejssnt.2006.490     Document Type: Conference Paper

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