Atomic force microscopy of Bacillus spore surface morphology

Micron

Volumn 37, Issue 4, 2006, Pages 363-369

  Zolock, Ruth A ^a   Li, Guangming ^a   Bleckmann, Charles ^a   Burggraf, Larry ^a   Fuller, Douglas C ^b  

^a AIR FORCE INSTITUTE OF TECHNOLOGY   (United States)

^b WRIGHT PATTERSON AIR FORCE BASE   (United States)

Author keywords

AFM; B. anthracis; Bacillus; Spore surface

Indexed keywords

ATOMIC FORCE MICROSCOPY; CRYSTAL MICROSTRUCTURE; IMAGE ANALYSIS; MORPHOLOGY; STATISTICAL METHODS;

B. ANTHRACIS; BACILLUS; PHASE IMAGES; SPORE SURFACE;

BACTERIA;

ARTICLE; ATOMIC FORCE MICROSCOPY; BACILLUS; BACILLUS ANTHRACIS; BACILLUS CEREUS; BACILLUS THURINGIENSIS; BACTERIAL SPORE; CLASSIFICATION; COMPARATIVE STUDY; SPECIES DIFFERENCE; SURFACE PROPERTY; ULTRASTRUCTURE;

BACILLUS; BACILLUS ANTHRACIS; BACILLUS CEREUS; BACILLUS THURINGIENSIS; MICROSCOPY, ATOMIC FORCE; SPECIES SPECIFICITY; SPORES, BACTERIAL; SURFACE PROPERTIES;

BACILLUS (BACTERIUM); BACILLUS ANTHRACIS; BACILLUS ANTHRACIS STR. STERNE; BACILLUS CEREUS; BACILLUS SUBTILIS; BACILLUS THURINGIENSIS; BACILLUS THURINGIENSIS SEROVAR KURSTAKI; BACTERIA (MICROORGANISMS);

EID: 33646595319     PISSN: 09684328     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.micron.2005.11.006     Document Type: Article

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