Development of a ToF version of the desktop MiniSIMS: Instrument design and applications

Surface and Interface Analysis

Volumn 38, Issue 4, 2006, Pages 699-702

  Cliff, B ^a   Eccles, A J ^a   Jones, C ^a   Long, N ^a   Vohralik, P ^a  

^a Millbrook Instruments Limited   (United Kingdom)

Author keywords

Desktop; Instrumentation; SIMS; Time of flight (ToF)

Indexed keywords

COST EFFECTIVENESS; COSTS; IMAGING TECHNIQUES; POSITIVE IONS; SURFACE CHEMISTRY; TIME DOMAIN ANALYSIS;

DESKTOP; INSTRUMENTATION; QUADRUPOLE MASS ANALYZERS; TIME OF FLIGHT (TOF);

SECONDARY ION MASS SPECTROMETRY;

EID: 33646551807     PISSN: 01422421     EISSN: 10969918     Source Type: Journal    
DOI: 10.1002/sia.2281     Document Type: Conference Paper

References (6)

1. Eccles AJ, Steele TA, Robinson AW. Appl. Surf. Sci. 1999; 144: 106.
2. Eccles AJ, Cliff B, Jones C, Long N, Vohralik P. In SIMS XV, Proceedings of the 15th International Conference in Secondary Ion Mass Spectrometry, Manchester, 2005; accepted for publication.
3. Schueler BW. ToF-SIMS: Surface Analysis by Mass Spectrometry. Vickerman JC, Briggs D (eds), Chapt. 3. IM Publications & SurfaceSpectra Limited: Manchester, UK, 2001; ToF Mass Analysers.
4. Hill R. ToF-SIMS: Surface Analysis by Mass Spectrometry. Vickerman JC, Briggs D (eds), Chapt. 4. IM Publications & SurfaceSpectra Limited: Manchester, UK, 2001; Primary Ion Beam Systems.
5. Gilmore IS, Seah MP. Surf. Interface Anal. 2000; 29: 624.
6. Vickerman JC, Briggs D, Henderson A (eds). The Static SIMS Library. SurfaceSpectra Limited: Manchester, UK, 2002-05; www.surfacespectra.com.