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Volumn 16, Issue 2, 2006, Pages 315-321

Fillet-lifting mechanism for Sn-Bi-Ag-Cu solder joint in lead-free wave soldering

Author keywords

Crystalline crack; Fillet lifting; Lead free wave soldering; Segregation; Su Bi Ag Cu solder

Indexed keywords

AGGLOMERATION; BISMUTH; COPPER; CRACK INITIATION; CRACK PROPAGATION; CRACKS; CRYSTALLIZATION; MATHEMATICAL MODELS; PLASTICITY; SEGREGATION (METALLOGRAPHY); SHRINKAGE; SILVER; SOLDERED JOINTS; STRAIN; STRESS CONCENTRATION; TIN;

EID: 33646508784     PISSN: 10040609     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article
Times cited : (3)

References (15)
  • 1
    • 33646495631 scopus 로고    scopus 로고
    • Reliability of Pb-free solder joints of surface-mounted LSI packages after flow-solder
    • Nakatsuka T. Reliability of Pb-free solder joints of surface-mounted LSI packages after flow-solder[J]. IMAPS, 2000, 9: 330-335.
    • (2000) IMAPS , vol.9 , pp. 330-335
    • Nakatsuka, T.1
  • 2
    • 33646496249 scopus 로고    scopus 로고
    • NIST research in lead lead-free solders: Properties, processing, reliability
    • National Institute of Standards and Technology (NIST)
    • Handwerker C. NIST Research in Lead Lead-Free Solders: Properties, Processing, Reliability[R]. National Institute of Standards and Technology (NIST), 2002.
    • (2002)
    • Handwerker, C.1
  • 3
    • 85009573466 scopus 로고    scopus 로고
    • Influence of various factors on lift-off phenomenon in wave soldering with Sn-Bi alloy
    • Suganuma K. Influence of various factors on lift-off phenomenon in wave soldering with Sn-Bi alloy[J]. Jpn Inst Electron Package, 1999, 2: 116-20.
    • (1999) Jpn Inst Electron Package , vol.2 , pp. 116-120
    • Suganuma, K.1
  • 5
    • 0005167661 scopus 로고    scopus 로고
    • Mechanism and prevention of lift-off in lead-free soldering
    • Boston: Massa-chusetts
    • Suganuma K. Mechanism and prevention of lift-off in lead-free soldering[A]. Proc 33rd International Symposium on Microelectronics[C]. Boston: Massa-chusetts, 2000. 303-307.
    • (2000) Proc 33rd International Symposium on Microelectronics , pp. 303-307
    • Suganuma, K.1
  • 6
    • 0003455833 scopus 로고    scopus 로고
    • Lead-free solder project final report
    • Germany: UNCMS, Report0401RE96
    • Lead-Free Solder Project Final Report[R]. Germany: UNCMS, Report0401RE96. 1997.
    • (1997)
  • 7
    • 0032478374 scopus 로고    scopus 로고
    • Microstructural features of lift-off phenomenon in through-hole circuit soldered by Sn-Bi alloy
    • Suganuma K. Microstructural features of lift-off phenomenon in through-hole circuit soldered by Sn-Bi alloy[J]. Scripta Materialia, 1998, 138(9): 1333-1340.
    • (1998) Scripta Materialia , vol.138 , Issue.9 , pp. 1333-1340
    • Suganuma, K.1
  • 8
    • 0034502891 scopus 로고    scopus 로고
    • Lift-off phenomenon in wave soldering
    • Suganuma K. Lift-off phenomenon in wave soldering[J]. Acta Materialia, 2000, 48: 4475-81.
    • (2000) Acta Materialia , vol.48 , pp. 4475-4481
    • Suganuma, K.1
  • 11
    • 0005167661 scopus 로고    scopus 로고
    • Mechanism and prevention of lift-off in lead-free soldering
    • Suganuma K. Mechanism and prevention of lift-off in lead-free soldering[J]. IMAPS, 2000, 9: 325-329.
    • (2000) IMAPS , vol.9 , pp. 325-329
    • Suganuma, K.1
  • 13
    • 33646512926 scopus 로고    scopus 로고
    • Evaluation results on reliability of lead-free Solder-Tabai espec efforts to develop viable lead-free solder
    • ESPEC Technology Report
    • Hirokazu T, Yuichi A, Hiroko K. Evaluation Results on Reliability of Lead-free Solder-Tabai Espec Efforts to Develop Viable Lead-free Solder[R]. ESPEC Technology Report, 2002, 11.
    • (2002) , pp. 11
    • Hirokazu, T.1    Yuichi, A.2    Hiroko, K.3
  • 15
    • 2142810383 scopus 로고    scopus 로고
    • Database for solder properties with emphasis on new lead-free solders
    • Germany: National Institute of Standards and Technology and Colorado School of Mines
    • Database for Solder Properties with Emphasis on New Lead-free Solders[R]. Germany: National Institute of Standards and Technology and Colorado School of Mines, 2002.
    • (2002)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.