Characterization, design, modeling, and model validation of silicon on-wafer M:N balun components under matched and unmatched conditions

IEEE Journal of Solid-State Circuits

Volumn 41, Issue 5, 2006, Pages 1201-1208

  Rotella, Francis M ^a,b,c   Cismaru, Cristian ^a,b,e   Tkachenko, Yevgeniy Gene ^b,f   Cheng, Yuhua ^a,d   Zampardi, Peter J ^a,b,g,h  

^a IEEE   (United States)

^b SKYWORKS SOLUTIONS INC   (United States)

^c FUJITSU LABORATORIES OF AMERICA   (United States)

^d Siliconlinx Inc   (United States)

^e Device Design and Technology Characterization Group   (United States)

^f Skyworks Solutions   (United States)

^g Rockwell Semiconductor Systems

^h Device Design Characterization and Modeling Group ^*

Author keywords

Baluns; Monolithic transformers and inductors; Radio frequency integrated circuit design; Semiconductor device modeling; Silicon

Indexed keywords

BALUNS; MONOLITHIC TRANSFORMERS AND INDUCTORS; RADIO FREQUENCY INTEGRATED CIRCUIT DESIGN; SEMICONDUCTOR DEVICE MODELING;

GEOMETRY; INTEGRATED CIRCUITS; MATHEMATICAL MODELS; PARAMETER ESTIMATION; SEMICONDUCTOR DEVICES; SKIN EFFECT;

SILICON WAFERS;

EID: 33646429186     PISSN: 00189200     EISSN: None     Source Type: Journal    
DOI: 10.1109/JSSC.2006.872736     Document Type: Conference Paper

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