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Volumn , Issue , 2005, Pages 291-294
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Characterization, design, modeling, and model validation of silicon on-wafer M:N balun components under match and un-matched conditions
a b c |
Author keywords
[No Author keywords available]
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Indexed keywords
CIRCUIT CONFIGURATIONS;
IMPEDANCE TRANSFORMATION;
RFIC DESIGN;
ELECTRIC IMPEDANCE;
MATHEMATICAL MODELS;
SILICON WAFERS;
SKIN EFFECT;
INTEGRATED CIRCUIT LAYOUT;
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EID: 27644486975
PISSN: 15292517
EISSN: None
Source Type: Conference Proceeding
DOI: None Document Type: Conference Paper |
Times cited : (6)
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References (6)
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