Built-in high resolution signal generator for testing ADC and DAC

International Symposium on VLSI Technology, Systems, and Applications, Proceedings

Volumn 2003-January, Issue , 2003, Pages 231-234

  Chang, Yeong Jar ^a   Chang, Soon Jyh ^a   Ho, Jung Chi ^a   Ong, Chee Kian ^b   Cheng, Ting ^b   Wu, Wen Ching ^a  

^a INDUSTRIAL TECHNOLOGY RESEARCH INSTITUTE   (Taiwan)

^b Santa Barbara   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ANALOG TO DIGITAL CONVERSION; APPLICATION SPECIFIC INTEGRATED CIRCUITS; DIGITAL INTEGRATED CIRCUITS; DIGITAL TO ANALOG CONVERSION; MODEMS; PROGRAMMABLE LOGIC CONTROLLERS; SIGNAL GENERATORS; SYSTEM-ON-CHIP; TELEPHONE LINES;

ANALOG TO DIGITAL CONVERTERS; DIGITAL SUBSCRIBER LINE SYSTEMS; HIGH RESOLUTION; ON CHIPS; SIGMA DELTA;

INTEGRATED CIRCUIT DESIGN;

EID: 33646405670     PISSN: 19308868     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/VTSA.2003.1252595     Document Type: Conference Paper

References (8)

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