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Volumn 110, Issue 13, 2006, Pages 6832-6840

Understanding gold-thiolate cluster emission from self-assembled monolayers upon kiloelectronvolt ion bombardment

Author keywords

[No Author keywords available]

Indexed keywords

ELECTROMAGNETIC WAVE EMISSION; ION BOMBARDMENT; PROJECTILES; SECONDARY ION MASS SPECTROMETRY; SELF ASSEMBLY;

EID: 33646378674     PISSN: 15206106     EISSN: None     Source Type: Journal    
DOI: 10.1021/jp058252f     Document Type: Article
Times cited : (16)

References (30)
  • 2
    • 33646337286 scopus 로고    scopus 로고
    • Vickerman, J. C., Briggs, D., Eds. ToF-SIMS: Surface Analysis by Mass Spectrometry; SurfaceSpectra/IMP: Chichester, U.K.
    • Vickerman, J. C., Briggs, D., Eds. ToF-SIMS: Surface Analysis by Mass Spectrometry; SurfaceSpectra/IMP: Chichester, U.K., 2001.
    • (2001)
  • 7
    • 0001426801 scopus 로고    scopus 로고
    • Vickerman J. C., Briggs, D., Eds.; SurfaceSpectra/IMP: Chichester, U.K.
    • Garrison, B. J. In ToF-SIMS: Surface Analysis by Mass Spectrometry; Vickerman J. C., Briggs, D., Eds.; SurfaceSpectra/IMP: Chichester, U.K., 2001; p 223.
    • (2001) ToF-SIMS: Surface Analysis by Mass Spectrometry , pp. 223
    • Garrison, B.J.1
  • 14
    • 0242358056 scopus 로고    scopus 로고
    • Vickerman, J. C., Briggs, D., Eds.; SurfaceSpectra/IMP: Chichester, U.K.
    • Leggett, G. J. In ToF-SIMS: Surface Analysis by Mass Spectrometry, Vickerman, J. C., Briggs, D., Eds.; SurfaceSpectra/IMP: Chichester, U.K., 2001; p 573.
    • (2001) ToF-SIMS: Surface Analysis by Mass Spectrometry , pp. 573
    • Leggett, G.J.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.