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Volumn 44, Issue 8, 2006, Pages 2694-2706

Lithographic design of photosensitive polyarylates based on reaction development patterning

Author keywords

High performance polymers; Photoresists; Polyarylates; Reaction development patterning (RDP); Structure property relations; Substituent (R) in the bisphenol moieties

Indexed keywords

LITHOGRAPHY; PHENOLS; PHOTORESISTS; PHOTOSENSITIVITY; PRODUCT DESIGN; REACTION KINETICS;

EID: 33646166566     PISSN: 0887624X     EISSN: 10990518     Source Type: Journal    
DOI: 10.1002/pola.21386     Document Type: Article
Times cited : (26)

References (20)
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    • Polymers for microelectronics and nanoelectronics
    • Lin, Q.; Pearson, R. A.; Hedrick, J. C., Eds.; American Chemical Society: Washington, DC
    • Polymers for Microelectronics and Nanoelectronics; Lin, Q.; Pearson, R. A.; Hedrick, J. C., Eds.; ACS Symposium Series 874; American Chemical Society: Washington, DC, 2004.
    • (2004) ACS Symposium Series , vol.874
  • 2
    • 0042414133 scopus 로고    scopus 로고
    • Micro- and nanopatterning polymers
    • Ito, H.; Reichmanis, E.; Nalamasu, O.; Ueno, T., Eds.; American Chemical Society: Washington, DC
    • Micro- and Nanopatterning Polymers; Ito, H.; Reichmanis, E.; Nalamasu, O.; Ueno, T., Eds.; ACS Symposium Series 706; American Chemical Society: Washington, DC, 1998.
    • (1998) ACS Symposium Series , vol.706


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.