High quality step-edge substrates for high- Tc superconducting devices

Review of Scientific Instruments

Volumn 77, Issue 3, 2006, Pages

  Wu, C H ^a   Chen, M J ^a   Chen, J C ^a   Chen, K L ^a   Yang, H C ^a   Hsu, M S ^b   Lai, T S ^b   Tsai, Y S ^c   Horng, H E ^c   Chen, J H ^d   Jeng, J T ^e  

^a NATIONAL TAIWAN UNIVERSITY   (Taiwan)

^b CHUNG YUAN CHRISTIAN UNIVERSITY   (Taiwan)

^c NATIONAL TAIWAN NORMAL UNIVERSITY   (Taiwan)

^d DA YEH UNIVERSITY   (Taiwan)

^e NATIONAL TAIPEI UNIVERSITY OF TECHNOLOGY   (Taiwan)

Author keywords

[No Author keywords available]

Indexed keywords

JOSEPHSON JUNCTION DEVICES; LARGE SCALE SYSTEMS; MICROSCOPIC EXAMINATION; QUANTUM INTERFERENCE DEVICES; SURFACE PHENOMENA;

ARBITRARY STEP ANGLES; COMPLICATED SYSTEMS; FABRICATION METHODS; SURFACE MICROSCOPY;

SUPERCONDUCTING DEVICES;

EID: 33645894173     PISSN: 00346748     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2179407     Document Type: Article

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