RFI-induced distortion in switched-capacitor circuits

IEEE Transactions on Circuits and Systems I: Regular Papers

Volumn 53, Issue 4, 2006, Pages 784-794

  Crovetti, Paolo S ^a   Fiori, Franco L ^a  

^a POLITECNICO DI TORINO   (Italy)

Author keywords

Electromagnetic compatibility (EMC); Electromagnetic interference (EMI); Integrated circuits (ICs); Nonlinear circuit analysis; Sample and hold (SH); Switched capacitors (SC)

Indexed keywords

COMPUTER SIMULATION; ELECTRIC DISTORTION; ELECTRIC NETWORK ANALYSIS; ELECTROMAGNETIC COMPATIBILITY; INTEGRATED CIRCUITS; SIGNAL INTERFERENCE; TIME DOMAIN ANALYSIS;

NONLINEAR CIRCUIT ANALYSIS; RADIO-FREQUENCY INTERFERENCE; SAMPLE AND HOLD (SH); SWITCHED CAPACITORS;

MOS CAPACITORS;

EID: 33645817530     PISSN: 10577122     EISSN: None     Source Type: Journal    
DOI: 10.1109/TCSI.2005.861902     Document Type: Article

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