Polarimetric characterization of liquid-crystal-on-silicon panels

Applied Optics

Volumn 45, Issue 8, 2006, Pages 1688-1703

  Wolfe, Justin E ^a   Chipman, Russell A ^a  

^a UNIVERSITY OF ARIZONA   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

DATA REDUCTION; LIGHT POLARIZATION; LIQUID CRYSTALS; OPTICAL RESOLVING POWER; RADIOMETRY; SILICON;

CONTRAST RATIO; LIQUID-CRYSTAL-ON-SILICON (LCOS) PANELS; MUELLER MATRIX; TRIM RETARDERS;

POLARIMETERS;

EID: 33645773469     PISSN: 1559128X     EISSN: 15394522     Source Type: Journal    
DOI: 10.1364/AO.45.001688     Document Type: Review

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