Characterization of Polarization Aberrations in Liquid Crystal Devices

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 5188, Issue , 2003, Pages 1-5

  Wolfe, Justin ^a   Chipman, Russell ^a  

^a UNIVERSITY OF ARIZONA   (United States)

Author keywords

Imaging polarimeter; LCoS projector; Liquid crystal; Mueller matrix; Polarization aberrations

Indexed keywords

IMAGING POLARIMETER; LCOS PROJECTOR; MUELLER MATRIX; POLARIZATION ABERRATIONS;

ABERRATIONS; BANDWIDTH; INTEGRATED OPTICS; OPTICAL BEAM SPLITTERS; OPTICAL PROJECTORS; POLARIMETERS; POLARIZATION; PROJECTION SYSTEMS; SILICON;

LIQUID CRYSTAL DISPLAYS;

EID: 2342656439     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.505871     Document Type: Conference Paper

References (12)

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