Statistical BSIM model for MOSFET 1/f noise

Electronics Letters

Volumn 41, Issue 22, 2005, Pages 1208-1210

  Erturk M ^a,b   Xia, T ^a,b   Anna, R ^a   Newton, K M ^a   Adler, E ^a  

^a IBM   (United States)

^b UNIVERSITY OF VERMONT   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

BSIM MODEL; CORNER NOISE SIMULATIONS; HARDWARE CORRELATION; MOSFET 1/F NOISE; PROCESS DESIGN KIT;

CORRELATION METHODS; INTEGRATED CIRCUIT LAYOUT; MONTE CARLO METHODS; MOSFET DEVICES; STATISTICAL METHODS;

SPURIOUS SIGNAL NOISE;

EID: 33645728267     PISSN: 00135194     EISSN: None     Source Type: Journal    
DOI: 10.1049/el:20052372     Document Type: Article

References (6)

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2. Scholten, A.J.: et al. ' Noise modeling for RF CMOS circuit simulation ', IEEE Trans. Electron Devices, 2003, 50, p. 618-632
3. Ghibaudo, G.: ' Low frequency noise and fluctuations in advanced CMOS devices ', Proc. SPIE, 5113, Noise in Devices and Circuits, Deen, M.J., Çelik-Butler, Z., Levinshtein, M.E. (Eds), (SPIE, Bellingham, WA, 2003), pp. 16-28
4. Hung, K.K.: et al. ' A unified model for the flicker noise in metal-oxide-semiconductor field-effect transistors ', IEEE Trans. Electron Devices, 1990, 37, p. 654-665
5. Dennis, J.E.: ' Nonlinear least-squares ', Jacobs, D., 'State of the art in numerical analysis' (Academic Press 1977), p. 269-312
6. Devore, J.L.: ' Probability and statistics for engineering and the sciences ', (Duxbury Press 1995)