Mechanisms of nano-shorts in the electrical breakdown of ferroelectric thin films

Integrated Ferroelectrics

Volumn 73, Issue , 2005, Pages 93-98

  Lou, Xiaojie ^a   Hu, Xiaobing ^a   Zhang, Ming ^a   Redfern, S A T ^a   Scott, J F ^a  

^a UNIVERSITY OF CAMBRIDGE   (United Kingdom)

Author keywords

Breakdown; Fatigue; PbO and rutile; PZT

Indexed keywords

ELECTRIC BREAKDOWN; PEROVSKITE; PHASE TRANSITIONS; RAMAN SCATTERING; SCANNING ELECTRON MICROSCOPY; VOLTAGE CONTROL;

ELECTRON NANO-PROBE TECHNIQUES; LAYERED-PEROVSKITE STRUCTURE; PBO AND RUTILE; VOLTAGE CYCLING;

FERROELECTRIC THIN FILMS;

EID: 33645524979     PISSN: 10584587     EISSN: 16078489     Source Type: Conference Proceeding    
DOI: 10.1080/10584580500413772     Document Type: Conference Paper

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