-
1
-
-
0033301647
-
-
Voldman, J.; Gray, M. L.; Schmidt, M. A. Annu. Rev. Biomed. Eng. 1999, 1, 401-425.
-
(1999)
Annu. Rev. Biomed. Eng.
, vol.1
, pp. 401-425
-
-
Voldman, J.1
Gray, M.L.2
Schmidt, M.A.3
-
2
-
-
33645519472
-
-
U.S. Patent 3,230,163
-
(a) Dreyfus, B. A. U.S. Patent 3,230,163, 1966.
-
(1966)
-
-
Dreyfus, B.A.1
-
3
-
-
0038380563
-
-
(b) Wang, Z.; Yuan, J.; Zhang, J.; Xing, R.; Yan, D.; Han, Y. Adv. Mater. 2003, 15, 1009.
-
(2003)
Adv. Mater.
, vol.15
, pp. 1009
-
-
Wang, Z.1
Yuan, J.2
Zhang, J.3
Xing, R.4
Yan, D.5
Han, Y.6
-
4
-
-
17244366080
-
-
Bhangale, S. M.; Tjong, V.; Wu, L.; Yakovlev, N.; Moran, P. M. Adv. Mater. 2005, 17, 809-813.
-
(2005)
Adv. Mater.
, vol.17
, pp. 809-813
-
-
Bhangale, S.M.1
Tjong, V.2
Wu, L.3
Yakovlev, N.4
Moran, P.M.5
-
5
-
-
33645500852
-
-
Cabodi, M.; Turner, S. W. P.; Craighead, H. G. Anal. Chem. 2002, 74, 5469-5174.
-
(2002)
Anal. Chem.
, vol.74
, pp. 5469-15174
-
-
Cabodi, M.1
Turner, S.W.P.2
Craighead, H.G.3
-
6
-
-
2342469286
-
-
Seo, Y.-S.; Luo, H.; Samuilov, V. A.; Rafailovich, M. H.; Sokolov, K.; Gersappe, D.; Chu, B. Nano Lett. 2004, 4, 659.
-
(2004)
Nano Lett.
, vol.4
, pp. 659
-
-
Seo, Y.-S.1
Luo, H.2
Samuilov, V.A.3
Rafailovich, M.H.4
Sokolov, K.5
Gersappe, D.6
Chu, B.7
-
7
-
-
5344241941
-
-
Chou, S. Y.; Krauss, P. R.; Renstrom, P. J. J. Vac. Sci. Technol., B 1996, 14, 4129-4133.
-
(1996)
J. Vac. Sci. Technol., B
, vol.14
, pp. 4129-4133
-
-
Chou, S.Y.1
Krauss, P.R.2
Renstrom, P.J.3
-
8
-
-
0000730481
-
-
Hidber, P. C.; Helbig, W.; Kim, E.; Whitesides, G. M. Langmuir 1996, 12, 1375-1380.
-
(1996)
Langmuir
, vol.12
, pp. 1375-1380
-
-
Hidber, P.C.1
Helbig, W.2
Kim, E.3
Whitesides, G.M.4
-
9
-
-
0034607807
-
-
Kim, C.; Burrows, P. E.; Forrest, S. R. Science 2000, 288, 831-833.
-
(2000)
Science
, vol.288
, pp. 831-833
-
-
Kim, C.1
Burrows, P.E.2
Forrest, S.R.3
-
10
-
-
0037014680
-
-
Loo, Y.-L.; Willet, R. L.; Baldwin, K. W.; Rogers, J. A. J. Am. Chem. Soc. 2002, 124, 7654-7655.
-
(2002)
J. Am. Chem. Soc.
, vol.124
, pp. 7654-7655
-
-
Loo, Y.-L.1
Willet, R.L.2
Baldwin, K.W.3
Rogers, J.A.4
-
11
-
-
0347480557
-
-
Wang, Z.; Zhang, J.; Xing, R.; Yuan, J.; Yang, D.; Han, Y. J. Am. Chem. Soc. 2003, 125, 15278-15279.
-
(2003)
J. Am. Chem. Soc.
, vol.125
, pp. 15278-15279
-
-
Wang, Z.1
Zhang, J.2
Xing, R.3
Yuan, J.4
Yang, D.5
Han, Y.6
-
12
-
-
0038038837
-
-
Moran, C. E.; Radloff, C.; Halas, N. J. Adv. Mater. 2003, 15, 804-807.
-
(2003)
Adv. Mater.
, vol.15
, pp. 804-807
-
-
Moran, C.E.1
Radloff, C.2
Halas, N.J.3
-
13
-
-
0344737891
-
-
Lee, I.; Hammond, P. T.; Rubner, M. F. Chem. Mater. 2003, 15, 4583-4589.
-
(2003)
Chem. Mater.
, vol.15
, pp. 4583-4589
-
-
Lee, I.1
Hammond, P.T.2
Rubner, M.F.3
-
14
-
-
79956007504
-
-
Ng, W. K.; Wu, L.; Moran, P. M. Appl. Phys. Lett. 2002, 81, 3097-3099.
-
(2002)
Appl. Phys. Lett.
, vol.81
, pp. 3097-3099
-
-
Ng, W.K.1
Wu, L.2
Moran, P.M.3
-
15
-
-
33645501234
-
-
note
-
12 we showed this experimentally. In that experiment, three Si-(100) stamps with adsorbed Pd particles were heated for 2 min to 75, 125, and 200°C. Thereafter, the surface was wiped gently with a moist cotton bud. The X-ray photoelectron spectra (XPS) show no discernible Pd peaks in the samples, and hence the vast majority of the nanoparticles have been removed from the Si stamp.
-
-
-
-
16
-
-
0001058180
-
-
Boonekamp, E. P.; Kelly, J. J.; Fokkink, L. G. J. Langmuir 1994, 10, 4089-4094.
-
(1994)
J. Langmuir
, vol.10
, pp. 4089-4094
-
-
Boonekamp, E.P.1
Kelly, J.J.2
Fokkink, L.G.3
-
17
-
-
33645500098
-
-
note
-
2 surface was studied as a function of time. The amount of adsorption was estimated by measuring the Pd intensity on each sample using TOF-SIMS.
-
-
-
-
18
-
-
33645506198
-
-
note
-
Five Si(100) stamps were immersed in a PVP-stabilized Pd colloidal solution for 30 min. After drying, these stamps were heated, and heated polystyrene was embossed against the stamp at various stamping temperatures (75, 100, 125, 140, and 160°C). After stamping, the polystyrene surfaces were examined by TOF-SIMS.
-
-
-
|