SCOPUS 정보 검색 플랫폼

Volumn 76, Issue , 2005, Pages 103-109

Phase developments, microstructures, and ferroelectric properties of BiFeO3 thin films prepared by a solution

Author keywords

Ferroelectric materials; Perovskites; Sol gel process; X ray diffraction

Indexed keywords

ANNEALING; BISMUTH COMPOUNDS; COERCIVE FORCE; ELECTRODES; PARTIAL PRESSURE; PEROVSKITE; X RAY DIFFRACTION;

FURNACE ANNEALING; REMANENT POLARIZATION; SOL-GEL PROCESS;

THIN FILMS;

EID: 33645505429 PISSN: 10584587 EISSN: 16078489 Source Type: Conference Proceeding
DOI: 10.1080/10584580500413749 Document Type: Conference Paper

Times cited : (10)

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