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Volumn , Issue 4, 2006, Pages 442-444

Incidence and properties of nanoscale defects in silicalite

Author keywords

[No Author keywords available]

Indexed keywords

EPOXIDE; SILICALITE; SILICON DERIVATIVE; UNCLASSIFIED DRUG; ZEOLITE;

EID: 33645451429     PISSN: 13597345     EISSN: None     Source Type: Journal    
DOI: 10.1039/b513582f     Document Type: Article
Times cited : (11)

References (18)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.