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Volumn 101, Issue 48, 1997, Pages 9881-9885

Electron microscopic study of intergrowth of MFI and MEL: Crystal faults in B-MEL

Author keywords

[No Author keywords available]

Indexed keywords

BORON; CATALYST ACTIVITY; CRYSTAL GROWTH; CRYSTAL STRUCTURE; ELECTRON DIFFRACTION; GELS; SCANNING ELECTRON MICROSCOPY; STACKING FAULTS; SYNTHESIS (CHEMICAL); TRANSMISSION ELECTRON MICROSCOPY;

EID: 0031270885     PISSN: 15206106     EISSN: None     Source Type: Journal    
DOI: 10.1021/jp971448y     Document Type: Article
Times cited : (58)

References (17)
  • 15
    • 4043101787 scopus 로고    scopus 로고
    • WO Patent 95 09812, 1995
    • Nakagawa, Y. WO Patent 95 09812, 1995.
    • Nakagawa, Y.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.