Total reflection x-ray fluorescence spectrometer with parallel primary beam

X-Ray Spectrometry

Volumn 35, Issue 2, 2006, Pages 116-119

  Korotkikh, E M ^a  

^a PETERSBURG NUCLEAR PHYSICS INSTITUTE   (Russian Federation)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTROMAGNETIC WAVE REFLECTION; FLUORESCENCE; SPECTROMETERS;

ANGULAR DIVERGENCE; BEAM INTENSITY; CURVED MIRROR; FOCUSING OPTICS; PRIMARY BEAMS; SAMPLE POSITION; TOTAL REFLECTION X-RAY FLUORESCENCE; X-RAY FLUORESCENCE SPECTROMETER; X-RAY SOURCES;

MIRRORS;

EID: 33645288858     PISSN: 00498246     EISSN: 10974539     Source Type: Journal    
DOI: 10.1002/xrs.875     Document Type: Article

References (12)

1. Yoneda Y, Horiuchi T. Rev. Sci. Instrum. 1971; 42: 1069.
2. Prange A. Spectrochim. Acta, Part B 1989; 44: 437.
3. Torok S, Labar J, Injuk J Van Grieken R. Anal. Chem. 1996; 68: 467R.
4. Stoev KN, Krassimir N, Sakurai K. Spectrochim. Acta, Part B 1999; 54: 41.
5. Bernasconi G, Dargie M, Jaib MM, Tajani A. X-Ray Spectrom. 1997; 26: 203.
6. Ladisich W, Rieder R, Wobrauschek P, Aiginger H. Nucl. Instrum. Methods A 1993; 330: 501.
7. Kondurov IA, Korotkikh EM. Adv. X-Ray Anal. 1994; 37: 595.
8. Korotkikh EM. Adv. X-Ray Anal. 1994; 37: 515.
9. Kondurov IA, Korotkikh EM. RF Patent Russia 2158 918;
10. Russ. Bull. 2000; No. (31).
11. Knoth J, Beaven P, Michaelsen C, Schneider H, Schwenke H. X-Ray Spectrom. 1999; 28: 110.
12. Tsuji K, Wagatsuma K. X-Ray Spectrom. 2002; 31: 358.