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Volumn , Issue 3, 2003, Pages 881-884

Deep level characterization of undoped CdTe crystals

Author keywords

[No Author keywords available]

Indexed keywords

BRIDGMAN TECHNIQUES; CDTE CRYSTALS; DEEP-LEVELS; IMPURITY CONTENT; INNOVATIVE TECHNIQUES; SEMI-INSULATING MATERIALS; STRONGLY CONNECTED; VAPOUR TRANSPORT;

EID: 33645266777     PISSN: 16101634     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1002/pssc.200306234     Document Type: Conference Paper
Times cited : (8)

References (18)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.