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Volumn 60, Issue 13-14, 2006, Pages 1733-1735

Growth and characterization of high-quality δ-Bi2O 3 thin films grown by carbothermal evaporation

Author keywords

Deposition; Epitaxial growth; Thin films; X ray techniques

Indexed keywords

BISMUTH COMPOUNDS; DEPOSITION; EPITAXIAL GROWTH; EVAPORATION; FILM GROWTH; X RAY ANALYSIS;

EID: 33645227802     PISSN: 0167577X     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.matlet.2005.12.006     Document Type: Article
Times cited : (10)

References (16)
  • 14
    • 14144252734 scopus 로고    scopus 로고
    • JCPDS File No. 27-0052
    • International Centre of Diffraction Data, Release 2002 Powder Diffraction File, JCPDS File No. 27-0052 (2002).
    • (2002) Release 2002 Powder Diffraction File


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.