Conceptual evaluation of inversion models used for layered structures

IEEE Transactions on Magnetics

Volumn 42, Issue 4, 2006, Pages 1091-1094

  Gyimóthy, Szabolcs ^a   Pávó, József ^a   Tsuboi, Hajime ^b  

^a BUDAPEST UNIVERSITY OF TECHNOLOGY AND ECONOMICS   (Hungary)

^b FUKUYAMA UNIVERSITY   (Japan)

Author keywords

Inverse problems; Mesh generation; Nondestructive testing; Nonhomogeneous media; Optical components

Indexed keywords

MAGNETIC ANISOTROPY; MATHEMATICAL MODELS; NONDESTRUCTIVE EXAMINATION; OPTICAL PROPERTIES; POROUS SILICON;

MESH GENERATION; NONHOMOGENEOUS MEDIA; OPTICAL COMPONENTS;

INVERSE PROBLEMS;

EID: 33645162719     PISSN: 00189464     EISSN: None     Source Type: Journal    
DOI: 10.1109/TMAG.2006.872460     Document Type: Article

References (9)

1. J. Pávó and S. Gyimóthy, "Design method for optimal database used for inverse problems in ECT," in Electromagnetic Nondestructive Evaluation VIII, T. Sollier, D. Premel, and D. Lesselier, Eds. Amsterdam, The Netherlands: IDS Press, 2004, pp. 69-76.
2. M. Sambridge, "Finding acceptable models in nonlinear inverse problems using a neighborhood algorithm," Inverse Problems. vol. 17, pp. 387-403, 2001.
3. S. Gyimóthy and J. Pavo, "Qualification of the inverse problem of defect reconstruction using optimized mesh database," COMPEL, vol. 24, no. 2, pp. 436-445, 2005.
4. G. T. Reed and A. T. Knights, Silicon Photonics. New York: Wiley, 2004.
5. J. Volk, J. Balázs, A. L. Tóth, and I. Barsony, "Porous silicon multilayers for sensing by tuneable IR transmission filtering," Sens. Actuators B, vol. 100, pp. 163-167, 2004.
6. SCI Film Wizard™ Optical Thin Film Software [Online]. Available: http://www.sci-soft.com/downloads/Film Wizard Brochure.pdf
7. D. A. G. Bruggemann, "Berechnung verschiedener physikalischer Konstanten von heterogenen Substanzen," Ann. Phys., vol. 24, p. 636, 1935.
8. H. A. Haus, Waves and Fields in Optoelectronics. Englewood Cliffs, NJ: Prentice-Hall, 1984.
9. J. Volk, M. Fried, A. L. Tóth, and I. Barsony, "The ideal vehicle for optical model development: Porous silicon multilayers," Thin Solid Films, pp. 535-539, 2004.