Shape reconstruction of multiple cracks from ECT signals by means of a stochastic method

IEEE Transactions on Magnetics

Volumn 42, Issue 4, 2006, Pages 1079-1082

  Rebican, Mihai ^a   Chen, Zhenmao ^b   Yusa, Noritaka ^a   Janousek, Ladislav ^a   Miya, Kenzo ^a  

^a International Institute of Universality   (Japan)

^b XI'AN JIAOTONG UNIVERSITY   (China)

Author keywords

Eddy current testing (ECT); Multiple cracks; Nondestructive evaluation; Signal inversion; Tabu search

Indexed keywords

EDDY CURRENTS; NONDESTRUCTIVE EXAMINATION; PERFORMANCE; RANDOM PROCESSES; SIGNAL PROCESSING;

EDDY CURRENT TESTING (ECT); MULTIPLE CRACKS; SIGNAL INVERSION; TABU SEARCH;

CRACKS;

EID: 33645152580     PISSN: 00189464     EISSN: None     Source Type: Journal    
DOI: 10.1109/TMAG.2006.870967     Document Type: Article

References (12)

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